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Predicting Lifetimes Of CMOS ASIC's From Test DataConcise report discusses recent developments in use of semiempirical mathematical models to predict rates of failure and operating lifetimes of complementary metal oxide/semiconductor (CMOS) application-specific integrated circuits (ASIC's). Each model represents specific mechanism of failure. Once failure mechanisms and models relevant to given ASIC chosen, adjustable parameters in models fitted to life-test data acquired from representative integrated-circuit structures on test coupons fabricated along with ASIC's. Then design parameters of ASIC's incorporated into models, and models yield lifetimes.
Document ID
19930000478
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Buehler, Martin G.
(Caltech)
Zamani, Nasser
(Caltech)
Zoutendyk, John A.
(Caltech)
Date Acquired
August 16, 2013
Publication Date
August 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 8
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-18698
Accession Number
93B10478
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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