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Ballistic-Charge-Carrier Spectroscopy Of CoSi(2)/Si InterfacesReport discusses experiments in which ballistic-electron-emission microscopy (BEEM) and related ballistic-hole and charge-carrier-scattering spectroscopies used to investigate transport of electric-charge carriers (electrons and holes) in epitaxial CoSi2/Si system.
Document ID
19930000804
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Hecht, Michael H. (Caltech)
Kaiser, William J. (Caltech)
Fathauer, Robert W. (Caltech)
Bell, Lloyd D. (Caltech)
Lee, Edwin Y. (Caltech)
Date Acquired
August 16, 2013
Publication Date
December 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 12
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
NPO-18699
Accession Number
93B10804
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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