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X-ray focusing using microchannel platesWe present measurements of the X-ray focusing properties of square-pore microchannel plates (MCP's). Square-pore MCP's contain large numbers of closely packed optical surfaces, as required for grazing incidence X-ray optics. The surface of individual MCP channels has been measured and found to have high microroughness transverse to the channel axis and low microroughness parallel to the axis. The high frequency transverse roughness, on length scales greater than 400 nm, has a rms value of 5.9 nm and a Gaussian autocorrelation function with correlation length of 1.41 micron. We find that the geometric misalignments of the surfaces of different channels limit the angular resolution obtainable with current samples of MCP's to 7.1 arcmin.
Document ID
19930033835
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Kaaret, P.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Geissbuehler, P.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Chen, A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Glavinas, E.
(Columbia Univ. New York, United States)
Date Acquired
August 15, 2013
Publication Date
December 1, 1992
Publication Information
Publication: Applied Optics
Volume: 31
Issue: 34
ISSN: 0003-6935
Subject Category
Optics
Accession Number
93A17832
Funding Number(s)
CONTRACT_GRANT: NAGW-2721
CONTRACT_GRANT: NAG5-618
Distribution Limits
Public
Copyright
Other

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