Microstructural characterization of thin polymer films using Langley low energy positron flux generator

We have developed a highly efficient scheme for generating high fluxes of slow positrons. These positrons have been successfully used to measure lifetimes in thin test films. The lifetime data have been used to develop two structure-property models for the test films. The first model relates the free volume cell size to the molecular weight of the polymer repeat unit. The second model relates the free volume fraction to the dielectric constant of the polymer film.