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High temperature static strain measurement with an electrical resistance strain gageAn electrical resistance strain gage that can supply accurate static strain measurement for NASP application is being developed both in thin film and fine wire forms. This gage is designed to compensate for temperature effects on substrate materials with a wide range of thermal expansion coefficients. Some experimental results of the wire gage tested on one of the NASP structure materials, i.e., titanium matrix composites, are presented.
Document ID
19930038316
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Lei, Jih-Fen
(Sverdrup Technology, Inc.; NASA, Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 16, 2013
Publication Date
December 1, 1992
Subject Category
Instrumentation And Photography
Report/Patent Number
AIAA PAPER 92-5039
Meeting Information
Meeting: AIAA, International Aerospace Planes Conference
Location: Orlando, FL
Country: United States
Start Date: December 1, 1992
End Date: December 4, 1992
Sponsors: AIAA
Accession Number
93A22313
Distribution Limits
Public
Copyright
Other

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