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Low earth simulation and materials characterizationOxygen plasma ashers and an electron cyclotron resonance (ECR) sources are currently being used for low Earth orbit (LEO) simulation. The suitability of each of these simulation techniques is considered. Thin film coatings are characterized by optical techniques, including variable-angle spectroscopic ellipsometry, optical spectrophotometry, and laser light scatterometry. Atomic force microscopy (AFM) has been used to characterize the surface morphology of thin aluminum films as a function of substrate temperature during deposition. Results on diamondlike carbon (DLC) films show that DLC degrades with simulated atomic oxygen (AO) exposure at a rate comparable to Kapton polyimide. Since DLC is not as susceptible as Kapton to environmental factors such as moisture absorption, it could potentially provide more accurate measurements of AO fluence on short space flights.
Document ID
19930048296
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Synowicki, R. A.
(NASA Lewis Research Center Cleveland, OH, United States)
Hale, Jeffrey S.
(NASA Lewis Research Center Cleveland, OH, United States)
Woollam, John A.
(Nebraska Univ. Lincoln, United States)
Date Acquired
August 16, 2013
Publication Date
February 1, 1993
Publication Information
Publication: Journal of Spacecraft and Rockets
Volume: 30
Issue: 1
ISSN: 0022-4650
Subject Category
Astronautics (General)
Accession Number
93A32293
Funding Number(s)
CONTRACT_GRANT: NAG3-95
Distribution Limits
Public
Copyright
Other

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