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Analysis of upper and lower bounds of the frame noise in linear detector arraysThis paper estimates the upper and lower bounds of the frame noise of a linear detector array that uses a one-dimensional scan pattern. Using chi-square distribution, it is analytically shown why it is necessary to use the average of the variances and not the average of the standard deviations to estimate these bounds. Also, a criteria for determining whether any excessively noisy lines exist among the detectors is derived from these bounds. Using a Gaussian standard random variable generator, these bounds are demonstrated to be accurate within the specified confidence interval. A silicon detector array is then used for actual dark current measurements. The criterion developed for determination of noisy detectors is checked on the experimentally obtained data.
Document ID
19930049159
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Jaggi, S.
(Lockheed Engineering and Sciences Co.; NASA, Stennis Space Center Bay Saint Louis, MS, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1991
Publication Information
Publication: In: Infrared sensors: Detectors, electronics, and signal processing; Proceedings of the Meeting, San Diego, CA, July 24-26, 1991 (A93-33153 12-35)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Instrumentation And Photography
Accession Number
93A33156
Distribution Limits
Public
Copyright
Other

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