NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Performance of low resistance microchannel plate stacksResults are presented from an evaluation of three sets of low resistance microchannel plate (MCP) stacks; the tests encompassed gain, pulse-height distribution, background rate, event rate capacity as a function of illuminated area, and performance changes due to high temperature bakeout and high flux UV scrub. The MCPs are found to heat up, requiring from minutes to hours to reach stabilization. The event rate is strongly dependent on the size of the area being illuminated, with larger areas experiencing a gain drop onset at lower rates than smaller areas.
Document ID
19930050385
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Siegmund, O. H. W.
(NASA Headquarters Washington, DC United States)
Stock, J.
(California Univ. Berkeley, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1991
Publication Information
Publication: In: EUV, X-ray, and gamma-ray instrumentation for astronomy II; Proceedings of the Meeting, San Diego, CA, July 24-26, 1991 (A93-34376 13-35)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Electronics And Electrical Engineering
Accession Number
93A34382
Funding Number(s)
CONTRACT_GRANT: NAGW-1290
CONTRACT_GRANT: NGR-05-003-450
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available