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Instrument design and test results of the new all-reflection spatial heterodyne spectrometerAn all-reflection spatial heterodyne spectrometer (SHS) has been recently developed. The advantages over conventional high-resolution grating spectrometers are that the SHS requires no mechanical scanning, a self-compensating optical design permits easy alignment, and it is much smaller than other spectrometers of comparable resolution. Since all beam-splits and recombinations occur by reflection off of a diffraction grating, the interferometer is capable of operating well into the extreme ultraviolet (EUV) and possibly into the soft X-ray region. A description of the design and the characteristics of the instrument is presented. Also, test results, including sample interferograms as well as their Fourier-transformed spectra, at both visible and UV wavelengths are shown. Finally, we report on future developments and possible applications.
Document ID
19930050399
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Bush, Brett C.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Cotton, Daniel M.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Vickers, James C.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Chakrabarti, Supriya
(California Univ. Berkeley, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1991
Publication Information
Publication: In: EUV, X-ray, and gamma-ray instrumentation for astronomy II; Proceedings of the Meeting, San Diego, CA, July 24-26, 1991 (A93-34376 13-35)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Instrumentation And Photography
Accession Number
93A34396
Funding Number(s)
CONTRACT_GRANT: NAG5-675
Distribution Limits
Public
Copyright
Other

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