Lumped elements characterize Q in dielectric resonators

It has been earlier observed (Podcameni et al., 1981) that, as the coupling factor between a microstrip-coupled dielectric resonator and the line becomes much larger than unity, the unloaded quality factor (Q) of the resonator decreases. In this paper it is shown that this effect can be explained using lumped-element models of the coupling line, when the dielectric resonator is either overcoupled or undercoupled to the line.