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Cosmic X-ray spectroscopy with multilayer opticsMultilayer optics operated at normal incidence offer a powerful new technology for the study of the solar spectrum in the XUV. The spectra of most cosmic X-ray sources are strongly extinguished at wavelengths above 40 A due to absorption and scattering by interstellar grains. We describe a number of configurations which allow multilayer optics to be used at nonnormal angles of incidence in conjunction with grazing incidence optics to analyze the spectra of cosmic X-ray sources in the wavelength interval between 1.5 and 40 A. These optical configurations utilize both multilayer mirrors and gratings, and permit the efficient observation of extended sources using stigmatic spectrographs. The response of the instruments described to typical cosmic X-ray sources is also discussed.
Document ID
19930055682
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Walker, Arthur B. C., Jr.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Martinez, Dennis S.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Paris, Elizabeth S.
(Stanford Univ. CA, United States)
Hoover, Richard B.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Barbee, Troy W., Jr.
(Lawrence Livermore National Lab. Livermore, CA, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1992
Publication Information
Publication: In: Multilayer and grazing incidence X-ray(EUV optics; Proceedings of the Meeting, San Diego, CA, July 22-24, 1991 (A93-39658 15-74)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Instrumentation And Photography
Accession Number
93A39679
Distribution Limits
Public
Copyright
Other

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