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Minority carrier diffusion length and edge surface-recombination velocity in InPA scanning electron microscope was used to obtain the electron-beam-induced current (EBIC) profiles in InP specimens containing a Schottky barrier perpendicular to the scanned (edge) surface. An independent technique was used to measure the edge surface-recombination velocity. These values were used in a fit of the experimental EBIC data with a theoretical expression for normalized EBIC (Donolato, 1982) to obtain the electron (minority carrier) diffusion length.
Document ID
19930066790
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Hakimzadeh, Roshanak
(Sverdrup Technology, Inc., Brook Park; Case Western Reserve Univ. Cleveland, OH, United States)
Bailey, Sheila G.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 16, 2013
Publication Date
July 15, 1993
Publication Information
Publication: Journal of Applied Physics
Volume: 74
Issue: 2
ISSN: 0021-8979
Subject Category
Solid-State Physics
Accession Number
93A50787
Distribution Limits
Public
Copyright
Other

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