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Effect of trapped ions in a gated time-of-flight apparatusA three-mesh gate is used in a time-of-flight (TOF) apparatus to analyze the velocity of positive ions. Test results and a theoretical description are presented of an effect arising from trapping ions between meshes of a two-gate TOF velocity analyzer. The entrapped ions produce a side peak in the TOF spectra corresponding to faster ions. The onset and relative height of the side peak is dependent on the gating voltage and risetime of the pulsing electronics, while the relative intensity depends upon the velocity being sampled and the ratio of the gate width to duration.
Document ID
19930067292
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Martus, K. E.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Orient, O. J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Chutjian, A.
(JPL Pasadena, CA, United States)
Date Acquired
August 16, 2013
Publication Date
July 1, 1993
Publication Information
Publication: Review of Scientific Instruments
Volume: 64
Issue: 7
ISSN: 0034-6748
Subject Category
Instrumentation And Photography
Accession Number
93A51289
Distribution Limits
Public
Copyright
Other

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