NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Microchemical analysis of the SCS-6 silicon carbide fiberA detailed quantitative study of the microstructural variation of chemical composition of chemically vapor-deposited commercial SiC SCS-6 fiber is presented. Chemical etching and various electron-optical techniques including SEM, TEM, scanning Auger microscopy, AES, and parallel electron energy loss spectroscopy are used to analyze the chemical composition of the as-received fiber. In addition, some results on stereology of the high-temperature annealed fiber are presented. The results show that the carbon-to-silicon atom ratio in the SiC layers decreases in a stepwise fashion from about 3:2 to about 1:1 in going from the innermost layer to the outermost layer.
Document ID
19930069737
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Ning, Xian-Jie
(NASA Lewis Research Center Cleveland, OH, United States)
Pirouz, Pirouz
(Case Western Reserve Univ. Cleveland, OH, United States)
Farmer, Serene C.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 16, 2013
Publication Date
August 1, 1993
Publication Information
Publication: American Ceramic Society, Communications
Volume: 76
Issue: 8
ISSN: 0002-7820
Subject Category
Nonmetallic Materials
Accession Number
93A53734
Funding Number(s)
CONTRACT_GRANT: NCC3-73
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available