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Determining Directional Emittance With An Infrared ImagerDirectional emittances of flat specimen of smooth-surfaced, electrically nonconductive material at various temperatures computed from measurements taken by infrared radiometric imager operating in conjunction with simple ancillary equipment. Directional emittances useful in extracting detailed variations of surface temperatures from infrared images of curved, complexly shaped other specimens of same material. Advantages: simplification of measurement procedure and reduction of cost.
Document ID
19940000111
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Daryabeigi, Kamran (NASA Langley Research Center, Hampton, VA.)
Alderfer, David W. (NASA Langley Research Center, Hampton, VA.)
Wright, Robert E., Jr. (NASA Langley Research Center, Hampton, VA.)
Puram, Chith K. (Vigyan, Inc.)
Date Acquired
August 16, 2013
Publication Date
February 1, 1994
Publication Information
Publication: Laser Tech. Brief.
Volume: 2
Issue: 1
Subject Category
Physical Sciences
Report/Patent Number
LAR-14971
Accession Number
94B10111
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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