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Measuring Roughnesses Of Optical SurfacesReport discusses use of scanning tunneling microscopy and atomic force microscopy to measure roughnesses of optical surfaces. These techniques offer greater spatial resolution than other techniques. Report notes scanning tunneling microscopes and atomic force microscopes resolve down to 1 nm.
Document ID
19940000122
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Coulter, Daniel R. (Caltech)
Al-Jumaily, Gahnim A. (Caltech)
Raouf, Nasrat A. (Caltech)
Anderson, Mark S. (Caltech)
Date Acquired
August 16, 2013
Publication Date
February 1, 1994
Publication Information
Publication: Laser Tech. Brief.
Volume: 2
Issue: 1
Subject Category
Physical Sciences
Report/Patent Number
NPO-18857
Accession Number
94B10122
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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