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Electromagnetic Flaw Detector Is Easier To UseElectromagnetic flaw detector based on eddy-current principle. It nondestructively detects cracks, voids, and other flaws introducing electrical discontinuities into specimens of electrically conductive materials. Circuitry associated with this flaw detector simpler than older eddy-current flaw detectors. Unlike older eddy-current nondestructive testers, calibration ordinarily not needed, and readings interpreted with relative ease.
Document ID
19940000364
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Clendenin, C. Gerald (NASA Langley Research Center, Hampton, VA.)
Namkung, Min (NASA Langley Research Center, Hampton, VA.)
Simpson, John W. (Lockheed Engineering & Sciences Co.)
Fulton, James P. (Analytical Services and Materials, Inc.)
Wincheski, Buzz (Analytical Services and Materials, Inc.)
Todhunter, Ronald G. (Analytical Services and Materials, Inc.)
Date Acquired
August 16, 2013
Publication Date
July 1, 1994
Publication Information
Publication: NASA Tech Briefs
Volume: 18
Issue: 7
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
LAR-15046
Accession Number
94B10364
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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