NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Remote Measurement Of Thickness Of IceTechnique for remote measurement of thickness of ice layer on surface proposed. Surfaces measured optoelectronically. Radiation in three near-infrared wavelength bands scattered from both test spot and nearby reference spot, and ratios of intensities compared to determine thickness of ice. Technique applicable to all surfaces appropriately lit with adequate radiation in three preselected bands. Useful in variety of applications, including aerospace applications, research, and measurement of ice thicknesses on aircraft surfaces.
Document ID
19940000406
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Singh, Jag J.
(NASA Langley Research Center, Hampton, VA.)
Date Acquired
August 16, 2013
Publication Date
July 1, 1994
Publication Information
Publication: Laser Tech. Brief.
Volume: 2
Issue: 3
Subject Category
Physical Sciences
Report/Patent Number
LAR-14636
Accession Number
94B10406
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.
No Preview Available