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Improvements In Optically Stimulated Electron EmissionOptically stimulated electron emission (OSEE) used in inspection for contamination of critical bonding surfaces in solid rocket motors of Space Shuttle prior to formation of adhesive bonds on surfaces during manufacture and refurbishment. Fundamental OSEE inspection technique described in "Surface-Contamination Inspection Tool for Field Use" (MFS-25581) and "Detecting Contamination With Photoelectron Emission" (MFS-25619). OSEE measurement head easily portable, and measurement operation convenient and rapid, making it useful inspection technique in industrial environment. Reveals contamination in many situations in which other techniques do not work.
Document ID
19940000672
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Yost, William T. (NASA Langley Research Center, Hampton, VA.)
Welch, Christopher S. (College of William and Mary)
Joe, Edmond J. (Analytical Services and Materials, Inc.)
Hefner, Bill B., Jr. (Analytical Services and Materials, Inc.)
Date Acquired
August 16, 2013
Publication Date
December 1, 1994
Publication Information
Publication: NASA Tech Briefs
Volume: 18
Issue: 12
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
LAR-15063
Accession Number
94B10672
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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