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Fatigue-Crack-Tip LocatorFatigue-testing system includes automated subsystem continuously tracking location of fatigue-crack tip in metal or other highly electrically conductive specimen. Fatigue-crack-tip-locating subsystem also searches specimen to find initial fatigue crack and its tip and to trace out hidden fatigue cracks and other flaws inside specimen. Subsystem operates under overall control of personal computer, which also controls load frame applying prescribed cyclic stresses to specimen. Electromagnetic flaw detector based on eddy-current principle scanned over surface of specimen. Flaw detector described in "Electromagnetic Flaw Detector Is Easier To Use" (LAR-15046). System provides automated control and monitoring of fatigue experiments, saving time for researchers and enabling experiments to run unattended 24 hours a day. All information on crack-tip trajectories and rates of growth of cracks recorded automatically, so researchers have access to more information.
Document ID
19940000673
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Namkung, Min
(NASA Langley Research Center, Hampton, VA.)
Clendenin, C. Gerald
(NASA Langley Research Center, Hampton, VA.)
Wincheski, Buzz
(Analytical Services and Materials, Inc.)
Fulton, James P.
(Analytical Services and Materials, Inc.)
Todhunter, Ronald G.
(Analytical Services and Materials, Inc.)
Simpson, John W.
(Lockheed Engineering & Sciences Co.)
Date Acquired
August 16, 2013
Publication Date
December 1, 1994
Publication Information
Publication: NASA Tech Briefs
Volume: 18
Issue: 12
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
LAR-15085
Accession Number
94B10673
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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