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Directional emittance corrections for thermal infrared imagingA simple measurement technique for measuring the variation of directional emittance of surfaces at various temperatures using commercially available radiometric IR imaging systems was developed and tested. This technique provided the integrated value of directional emittance over the spectral bandwidth of the IR imaging system. The directional emittance of flat black lacquer and red stycast, an epoxy resin, measured using this technique were in good agreement with the predictions of the electromagnetic theory. The data were also in good agreement with directional emittance data inferred from directional reflectance measurements made on a spectrophotometer.
Document ID
19940035769
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Daryabeigi, Kamran
(NASA Langley Research Center Hampton, VA, United States)
Wright, Robert E., Jr.
(NASA Langley Research Center Hampton, VA, United States)
Puram, Chith K.
(Vigyan, Inc. Hampton, VA, United States)
Alderfer, David W.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1992
Publication Information
Publication: In: Thermosense XIV; Proceedings of the International Conference on Thermal Sensing and Imaging Diagnostic Applications, Orlando, FL, Apr. 22-24, 1992 (A94-12410 02-35)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Instrumentation And Photography
Accession Number
94A12424
Distribution Limits
Public
Copyright
Other

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