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Electrochemical characterization of InP structuresElectrochemical (EC) techniques represent a simple and yet accurate method to characterize InP and related materials structures. With EC techniques, uncertainties in the measurements arising from factors such as surface effects, the composition and thickness of a front dead layer, the contacts, etc., can be significantly reduced when both a suitable electrolyte is used and the measuring conditions are carefully selected. In this work, the use of photoelectrochemical techniques with InP structures is reported. The work focuses on both the characterization and the optimization of structures grown by thermal diffusion and by epitaxial methods. Characterization of the structures is done by studying the variation in the density of surface states, number of defects, and net majority carrier concentration as a function of material removed. A step-by-step optimization process of n(sup +)p and p(sup+)n InP structures is also described. This involves the passivation and subsequent removal of damaged layers in order to extract the performance parameters of solar cells fabricated with these structures.
Document ID
19950002249
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Faur, Maria
(NASA Lewis Research Center Cleveland, OH, United States)
Faur, Mircea
(NASA Lewis Research Center Cleveland, OH, United States)
Vargas-Aburto, Carlos
(NASA Lewis Research Center Cleveland, OH, United States)
Wilt, David M.
(NASA Lewis Research Center Cleveland, OH, United States)
Goradia, Manju
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 17, 2013
Publication Date
January 1, 1992
Publication Information
Publication: Twelfth Space Photovoltaic Research and Technology Conference (SPRAT 12)
Subject Category
Energy Production And Conversion
Accession Number
95N70369
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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