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Apparatus Tests Thermocouples For Seebeck InhomogeneityAutomated apparatus reveals sources of error not revealed in calibration. Computer-controlled apparatus detects and measures Seebeck inhomogeneities in sheathed thermocouples. Measures thermocouple output voltage as function of position of probe along sharp gradient of temperature. Abnormal variations in voltage-versus-position data indicative of Seebeck inhomogeneities. Prototype for development of standard method and equipment for routine acceptance/rejection testing of sheathed thermocouples in industrial and research laboratories.
Document ID
19950065181
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Burkett, Cecil G., Jr.
(NASA Langley Research Center, Hampton, VA.)
Bauserman, Willard A., Jr.
(NASA Langley Research Center, Hampton, VA.)
West, James W.
(NASA Langley Research Center, Hampton, VA.)
Date Acquired
August 17, 2013
Publication Date
January 1, 1995
Publication Information
Publication: NASA Tech Briefs
Volume: 19
Issue: 1
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
LAR-15198
Accession Number
95B10022
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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