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Measuring Work Functions Of "Dirty" Surfaces With A Vibrating Capacitive ProbeApparatus measures work function of possibly contaminated surface of specimen of metal or other electrically conductive material. Measures work function of specimen indirectly, by vibrating capacitive measurement of contact potential. Work function of specimen affected by microstructure and by contamination.
Document ID
19950065216
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Yost, William T. (NASA Langley Research Center, Hampton, VA.)
Date Acquired
August 17, 2013
Publication Date
February 1, 1995
Publication Information
Publication: NASA Tech Briefs
Volume: 19
Issue: 2
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
LAR-14671
Accession Number
95B10057
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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