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Optoelectronic Instruments For Analysis Of Surface DefectsFamily of portable optoelectronic instruments developed to facilitate inspection of surface flaws like gouges, scratches, raised metal, and dents on large metal workpieces subject to surface-finish requirements. Instrument brought to workpiece and semiautomatically makes electronic record of three-dimensional shape of flaw. Entire inspection process takes only minutes. Prototype instrument includes structured-light microscope. Concept involves projection of known pattern of light onto surface inspected. Topography of surface determined from distortion of pattern as viewed through instrument.
Document ID
19950065248
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Collins, J. David (NASA John F. Kennedy Space Center, Cocoa Beach, FL.)
Mueller, Robert P. (NASA John F. Kennedy Space Center, Cocoa Beach, FL.)
Davis, Richard M. (NASA John F. Kennedy Space Center, Cocoa Beach, FL.)
Gleman, Stuart M. (I-NET Space Services)
Hallberg, Carl G. (I-NET Space Services)
Thayer, Stephen W. (I-NET Space Services)
Thompson, David L. (I-NET Space Services)
Thompson, James E. (I-NET Space Services)
Date Acquired
August 17, 2013
Publication Date
February 1, 1995
Publication Information
Publication: Laser Tech. Brief.
Issue: 1
Subject Category
Electronic Systems
Report/Patent Number
KSC-11686
Accession Number
95B10089
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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