NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Projected-Fringe Profilometer Maps Erosion Of ElectrodeReport describes use of projected-fringe, phase-stepping optical profilometer to measure three-dimensional shape of surface of molybdenum electrode eroded in ion engine. Instrumentation used in these measurements similar to that described in "Projected-Fringe, Phase-Stepping Profilometer" (LEW-14996).
Document ID
19950065408
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Macrae, Gregory S. (NASA Lewis Research Center, Cleveland, OH.)
Mercer, Carolyn R. (NASA Lewis Research Center, Cleveland, OH.)
Date Acquired
August 17, 2013
Publication Date
May 1, 1995
Publication Information
Publication: NASA Tech Briefs
Volume: 19
Issue: 5
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
LEW-15947
Accession Number
95B10249
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available