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Measuring Traces Of Oxygen By Resonant Electron AttachmentMethod of detecting trace amounts of oxygen based on dissociative attachment of electrons to oxygen molecules followed by measurement of resulting flux of negative oxygen ions in mass spectrometer. High sensitivity achieved in method by exploiting resonance in dissociative attachment of electrons to oxygen molecules: electron-attachment cross section rises to high peak at incident electron kinetic energy of 6.2 eV. Relative concentrations below 1 ppb detected. Devised to increase sensitivity of detection of oxygen in processing chambers in which oxygen regarded as contaminant; for example, chambers used in making semiconductor devices and in growing high-purity crystals.
Document ID
19950070407
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Man, Kin Fung
(Caltech)
Boumsellek, Said
(Caltech)
Chutjian, Ara
(Caltech)
Date Acquired
August 16, 2013
Publication Date
November 1, 1995
Publication Information
Publication: NASA Tech Briefs
Volume: 19
Issue: 11
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
NPO-19098
Accession Number
95B10586
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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