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Effect Of Clock Mode On Radiation Hardness Of An ADCReport discusses techniques for testing and evaluating effects of total dosages of ionizing radiation on performances of high-resolution successive-approximation analog-to-digital converters (ADCs), without having to test each individual bit or transition. Reduces cost of testing by reducing tests to few critical parametric measurements, from which one determines approximate radiation failure levels providing good approximations of responses of converters for purpose of total-dose-radiation evaluations.
Document ID
19950070455
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Lee, Choon I.
(Caltech)
Rax, Bernie G.
(Caltech)
Johnston, Allan H.
(Caltech)
Date Acquired
August 16, 2013
Publication Date
November 1, 1995
Publication Information
Publication: NASA Tech Briefs
Volume: 19
Issue: 11
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-19697
Accession Number
95B10634
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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