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Measuring Thicknesses Of Vacuum-Deposited Organic Thin FilmsMethod of measuring thickness of thin organic liquid film deposited in vacuum involves use of quartz-crystal monitor (QCM) calibrated by use of witness plate that has, in turn, calibrated by measurement of absorption of infrared light in deposited material. Present procedure somewhat tedious, but once calibration accomplished, thicknesses of organic liquid deposits monitored in real time and in situ by use of QCM.
Document ID
19960021829
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
David, Carey E.
(McDonnell Douglas Corp.)
Date Acquired
August 17, 2013
Publication Date
April 1, 1996
Publication Information
Publication: NASA Tech Briefs
Volume: 20
Issue: 4
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
MSC-22324
Accession Number
96B10165
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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