NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Identification and Control of Gravity Related Defect Formation During Melt Growth of Bismuth-Silicate (Bi12SiO20)In the light of strong indications that a majority of critical defects formed in bismuth silicon oxide (BSO) during growth from the melt is related directly or indirectly to gravitational interference, it is suggested to use the reduced gravity environment of outer space for experimentation directed at the identification and control of these defects. The results of these experiments are expected to lead to advances in our understanding of crystal growth related defect formation in general and will establish a basis for effective defect engineering, the approach to efficient achievement of defect related, application specific properties in opto-electronic materials
Document ID
19990040362
Acquisition Source
Langley Research Center
Document Type
Conference Paper
Authors
Zheng, Y.
(Massachusetts Inst. of Tech. Cambridge, MA United States)
Witt, A. F.
(Massachusetts Inst. of Tech. Cambridge, MA United States)
Date Acquired
August 19, 2013
Publication Date
February 1, 1999
Publication Information
Publication: NASA Microgravity Materials Science Conference
Subject Category
Solid-State Physics
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available