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Exploiting Defect Clustering to Screen Bare Die for Infant Mortality Failure: An Experimental StudyWe present the first experimental results to establish that a binning strategy based on defect clustering can be used to screen bare die for early life failures. The data for this study comes from the SEMATECH test methods experiment.
Document ID
19990070938
Acquisition Source
Marshall Space Flight Center
Document Type
Reprint (Version printed in journal)
Authors
Lakin, David R., II (NASA Marshall Space Flight Center Huntsville, AL United States)
Singh, Adit D. (Auburn Univ. AL United States)
Date Acquired
August 19, 2013
Publication Date
January 1, 1999
Subject Category
Quality Assurance And Reliability
Meeting Information
Meeting: International Test
Location: Atlantic City, NJ
Country: United States
Start Date: September 28, 1999
End Date: September 30, 1999
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Other

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