NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Surface Morphology of Undoped and Doped ZnSe FilmsRare-earth doped ions in polar II-VI semiconductors have recently played an important role in the optical properties of materials and devices. In this study, undoped ZnSe and erbium doped ZnSe films were grown by radio frequency (RF) magnetron sputtering method. Atomic Force Microscopy (AFM) was used together with optical microscopy and UV-Vis spectroscopy to characterize the films. Doped samples were found to have higher surface roughness and quite different surface morphology compared to that of undoped samples. The grown films generally show a relatively smooth and uniform surface indicating that they are of overall good quality. The impact of plasma etching on ZnSe:Er film examined under AFM is also discussed.
Document ID
20000032235
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
George, T.
(Fisk Univ. Nashville, TN United States)
Hayes, M.
(Fisk Univ. Nashville, TN United States)
Chen, H.
(Fisk Univ. Nashville, TN United States)
Chattopadhyay, K.
(Fisk Univ. Nashville, TN United States)
Thomas E.
(Fisk Univ. Nashville, TN United States)
Morgan, S.
(Fisk Univ. Nashville, TN United States)
Burger, A.
(Fisk Univ. Nashville, TN United States)
Date Acquired
August 19, 2013
Publication Date
February 22, 1998
Publication Information
Publication: NASA University Research Centers Technical Advances in Aeronautics, Space Sciences and Technology, Earth Systems Sciences, Global Hydrology, and Education
Volume: 2 and 3
Subject Category
Solid-State Physics
Funding Number(s)
CONTRACT_GRANT: NCC8-133
CONTRACT_GRANT: B336497
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Document Inquiry

Available Downloads

There are no available downloads for this record.
No Preview Available