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Radiation Susceptibility Assessment of Off the Shelf (OTS) HardwareThe reduction in budgets, shortening of schedules and necessity of flying near state of the art technology have forced projects and designers to utilize not only modern, non-space rated EEE parts but also OTS boards, subassemblies and systems. New instrumentation, communications, portable computers and navigation systems for the International Space Station, Space Shuttle, and Crew Return Vehicle are examples of the realization of this paradigm change at the Johnson Space Center. Because of this change, there has been a shift in the radiation assessment methodology from individual part testing using low energy heavy ions to board and box level testing using high-energy particle beams. Highlights of several years of board and system level testing are presented along with lessons learned, present areas of concern, insights into test costs, and future challenges.
Document ID
20000110136
Acquisition Source
Johnson Space Center
Document Type
Preprint (Draft being sent to journal)
Authors
Culpepper, William X.
(NASA Johnson Space Center Houston, TX United States)
Nicholson, Leonard L.
Date Acquired
August 19, 2013
Publication Date
January 1, 2000
Subject Category
Spacecraft Instrumentation And Astrionics
Meeting Information
Meeting: Commercialization of Military and Space Electronics
Location: Los Angeles, CA
Country: United States
Start Date: February 1, 2000
End Date: February 28, 2000
Sponsors: Components Technology Inst., Inc.
Funding Number(s)
CONTRACT_GRANT: NAS9-5374
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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