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Thickness Measurement Device for Ice, or Ice Mixed with Water or Other LiquidA Device and Method are provide for determining the thickness of a layer of solid ice, a mixture of ice and water, or a mixture of ice arid other liquid, accumulated on the outer surface of an object. First and second total impedance sensors are operated at first and second frequencies. Corresponding first and second AC total impedance measuring circuits are coupled to The first and second sensors to produce output voltages based on the total impedance changes sensed by the sensors. A processor is coupled to the first and second measuring circuits to generate an output value using the measured output voltages. The output value s indicative of the thickness of the ice or ice and water mixture, or ice and other liquid.
Document ID
20010125619
Acquisition Source
Langley Research Center
Document Type
Other - Patent
Authors
Weinstein, Leonard M.
(NASA Langley Research Center Hampton, VA United States)
Date Acquired
August 20, 2013
Publication Date
May 29, 2001
Subject Category
Instrumentation And Photography
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-Case-LAR-16093-1|US-Patent-6,239,601
Patent Application
US-Patent-Appl-SN-545860|US-Patent-Appl-SN-060590|US-Patent-Appl-SN-619779
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