NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Dynamical Effects on the Escape of H and D: Martian Water ReservoirsThe evolution of water on Mars is dependent on the loss rates of H and D from its atmosphere, where the dominant loss mechanism for these constituents is Jeans escape. Throughout time, preferential escape of H over D has produced a deuterium rich atmosphere with a D/H ratio 5.2 times that of terrestrial water. Motion in the atmosphere of Mars is shown to change the Jeans escape rates of H and D in two important ways: (1) Atmospheric wind and rotation at the exobase increase the escape fluxes of H and D above the corresponding Jeans fluxes. (2) The percentage increase in escape flux due to motion is greatest for D. Recently, several models have been used to estimate the magnitudes of current and ancient crustal water reservoirs on Mars that freely exchange with its atmosphere. Differences in the reservoir sizes are influenced by differences in the composition at the exobase, thermal history of the atmosphere and the D/H ratio of earlier epochs as inferred from meteorites. When motion enhanced Jeans escape is applied to each of these models, it is shown in every case that factors (1) and (2) above lead to current and ancient crustal water reservoirs that are larger than those obtained without motion.
Document ID
20020061305
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Hartle, Richard E.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Einaudi, Franco
Date Acquired
August 20, 2013
Publication Date
January 1, 2002
Subject Category
Lunar And Planetary Science And Exploration
Meeting Information
Meeting: European Geophysical Society XXVII General Assembly
Location: Nice
Country: France
Start Date: April 21, 2002
End Date: April 26, 2002
Sponsors: European Geophysical Society
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.
No Preview Available