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Subsurface Microsensors for Assisted Recertification of TPS (SmarTPS)Commercialization of a competitive reusable launch vehicle (RLV) is a primary goal for both NASA and the U.S. aerospace industry. To expedite achievement of this goal, the Bantam-X Technology Program is funding development of innovative technologies to lower costs for access to space. Ground operations is one area where significant cost reduction is required. For the Shuttle fleet, ground operations account for over 80% of the life cycle costs, and TPS recertification accounts for 27% of the operation costs ($4.5M per flight). Bantam Task TPS-7, Subsurface Microsensors for Assisted Recertification of TPS (SmarTPS), is a joint effort between NASA centers and industry partners to develop rapid remote detection and scanning technology for inspection of TPS and detection of subsurface defects. This short paper will provide a general overview of the SmarTPS concept.
Document ID
20020080915
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Pallix, Joan B.
(Eloret Corp. United States)
Milos, Frank S.
(NASA Ames Research Center Moffett Field, CA United States)
Huestis, Dave
(SRI International Corp. United States)
Arnold, James O.
Date Acquired
August 20, 2013
Publication Date
January 1, 1999
Subject Category
Composite Materials
Meeting Information
Meeting: Sixth International Conference on Composites Engineering
Location: Orlando, FL
Country: United States
Start Date: June 27, 1999
End Date: July 3, 1999
Funding Number(s)
PROJECT: RTOP 242-82-85
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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