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A Bayesian Approach to Sensor CharacterizationThe physical model of a generic electro-optic sensor is derived and incorporated into a Bayesian framework for the estimation of key instrument parameters from calibration data. The sensor characterization thus achieved enables optimal subsequent removal of instrument effects from field data, leading to the highest possible accuracy in the retrieved physical quantities.
Document ID
20030062763
Acquisition Source
Ames Research Center
Document Type
Preprint (Draft being sent to journal)
Authors
Timucin, Dogan A.
(NASA Ames Research Center Moffett Field, CA, United States)
Date Acquired
August 21, 2013
Publication Date
May 5, 2003
Subject Category
Numerical Analysis
Meeting Information
Meeting: IEEE IGARSS
Location: Toulouse
Country: France
Start Date: July 21, 2003
End Date: July 25, 2003
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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