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X-Ray Scattering Polarimeters: An OverviewX-Ray polarimeters that exploit the polarization-dependence of Thompson scattering were among the first utilized to detect the linear polarization from an X-Ray source. We review the basic principals, survey and compare different approaches and contrast these with other techniques.
Document ID
20040034241
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
Weisskopf, Martin C.
Elsner, Ronald F.
Ramsey, Brian D.
ODell, Steven L.
Date Acquired
August 21, 2013
Publication Date
January 1, 2004
Subject Category
Optics
Meeting Information
Meeting: X-Ray Polarimetry Workshop
Location: Stanford, CA
Country: United States
Start Date: February 9, 2004
End Date: February 11, 2004
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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