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Synchronized Electronic Shutter System and Method for Thermal Nondestructive EvaluationThe invention is a synchronized electronic shutter system (SESS) and method for same side and through transmission thermal analysis and inspection of a material for finding defects, corrosion, disbond defects, integrity of a weld and determination of paint thickness. The system comprises an infrared detector that acquires background images of the sample. A shutter then covers the detector and lamps rapidly heat the sample above ambient temperature. Shutters cover all lamps at the same time the shutter over the infrared detector is opened. The infrared detector acquires a series of temperature images over time radiated from the sample a s the sample cools down. After collecting a series of temperature images taken by the SESS, a processed image is developed using one of the group comprising time derivative calculation, temperature normalization data reduction routine, thermal diffusivity curve fitting and averaging the series of temperature images.
Document ID
20040081216
Acquisition Source
Langley Research Center
Document Type
Other - Patent
Authors
Joseph N Zalameda
(Langley Research Center Hampton, United States)
William P Winfree
(Langley Research Center Hampton, United States)
Date Acquired
August 21, 2013
Publication Date
March 30, 2004
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NASA-Case-LAR-16126-1
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-6,712,502
Patent Application
US-Patent-Appl-SN-120225
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