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Measured Attenuation of Coplanar Waveguide on 6H, p-type SiC and High Purity Semi-Insulating 4H SiC through 800 KWireless sensors for high temperature applications such as oil drilling and mining, automobiles, and jet engine performance monitoring require circuits built on wide bandgap semiconductors. In this paper, the characteristics of microwave transmission lines on 4H-High Purity Semi-Insulating SiC and 6H, p-type SiC is presented as a function of temperature and frequency. It is shown that the attenuation of 6H, p-type substrates is too high for microwave circuits, large leakage current will flow through the substrate, and that unusual attenuation characteristics are due to trapping in the SiC. The 4H-HPSI SiC is shown to have low attenuation and leakage currents over the entire temperature range.
Document ID
20040111960
Acquisition Source
Glenn Research Center
Document Type
Preprint (Draft being sent to journal)
Authors
Ponchak, George E.
(NASA Glenn Research Center Cleveland, OH, United States)
Schwartz, Zachary D.
(Analex Corp. Cleveland, OH, United States)
Alterovitz, Samuel A.
(NASA Glenn Research Center Cleveland, OH, United States)
Downey, Alan N.
(NASA Glenn Research Center Cleveland, OH, United States)
Date Acquired
August 21, 2013
Publication Date
January 1, 2004
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: IEEE MTT-S International Microwave Symposium
Location: Fort Worth, TX
Country: United States
Start Date: June 6, 2004
End Date: June 11, 2004
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
OTHER: 22-714-07-09
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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