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Modeling contamination migration on the Chandra X-Ray ObservatoryDuring its first 5 years of operation, the cold (-60 C) optical blocking filter of the Advanced CCD Imaging Spectrometer (ACIS), on board the Chandra X-ray Observatory, has accumulated a contaminating layer that attenuates the low-energy x rays. To assist in assessing the likelihood of successfully baking off the contaminant, members of the Chandra Team developed contamination-migration simulation software. The simulation follows deposition onto and (temperature-dependent) vaporization from surfaces comprising a geometrical model of the Observatory. A separate thermal analysis, augmented by on-board temperature monitoring, provides temperatures for each surface of the same geometrical model. This paper describes the physical basis for the simulations, the methodologies, and the predicted migration of the contaminant for various bake-out scenarios and assumptions.
Document ID
20050215463
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
O'Dell, Stephen L.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Swartz, Douglas A.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Anderson, Scot K.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Chen, Kenny C.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Giordano, Rino J.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Knollenberg, Perry J.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Morris, Peter A.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Plucinsky, Paul P.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Tice, Neil W.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Tran, Hien
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 23, 2013
Publication Date
January 1, 2005
Subject Category
Astrophysics
Meeting Information
Meeting: 2005 SPIE Meeting
Location: San Diego, CA
Country: United States
Start Date: July 31, 2005
End Date: August 4, 2005
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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