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Single-event upset in advanced commercial power PC microprocessorsSingle-event upset from heavy ions in measured for advanced commercial microprocessors, comparing upset sensitivity in registers and d-cache for several generations of devices. Multiple-bit upsets and asymmetry in registers upset cross sections are also discussed.
Document ID
20060028712
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Irom, F.
Farmanesh, F.
Swift, G. M.
Johnston, A. H.
Date Acquired
August 23, 2013
Publication Date
July 21, 2003
Subject Category
Space Radiation
Distribution Limits
Public
Copyright
Other
Keywords
single-event upset advanced commercial power PC processors

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