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Ballistic-electron-emission Microscopy of Semiconductor HeterostructuresBalistic-electron-emission microscopy has developed from its beginning as a probe of Schottky barriers into a powerful nanometer-scale method for characterizing semiconductor interfaces and hot-electron transport.
Document ID
20060035836
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/23006
Authors
Bell, L. Douglas
Narayanamurti, Venkatesh
Date Acquired
August 23, 2013
Publication Date
November 1, 1997
Distribution Limits
Public
Copyright
Other
Keywords
Semiconductors Ballistic-electron-emission

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