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Heavy Ion and Proton Induced Single Event Transients in Linear DevicesThis paper presents a display of heavy-ion and proton-induced single event transients for selected linear devices. The transient vital signs are serious; low LET threshold, high voltage amplitude and extended pulse duration (microsecs.).
Document ID
20060036379
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/26065
Authors
Nichols, D. K.
Coss, J. R.
Miyahira, T.
Schwartz, H. R.
Date Acquired
August 23, 2013
Publication Date
June 27, 1996
Distribution Limits
Public
Copyright
Other
Keywords
heavy ions ions transients linear devices LET threshold pulse duration

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