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Methodology for Physics and Engineering of Reliable ProductsPhysics of failure approaches have gained wide spread acceptance within the electronic reliability community. These methodologies involve identifying root cause failure mechanisms, developing associated models, and utilizing these models to inprove time to market, lower development and build costs and higher reliability. The methodology outlined herein sets forth a process, based on integration of both physics and engineering principles, for achieving the same goals.
Document ID
20060036532
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Cornford, Steven L.
Gibbel, Mark
Date Acquired
August 23, 2013
Publication Date
October 22, 1996
Distribution Limits
Public
Copyright
Other
Keywords
failure analysis electronics reliability PACT (prevention analysis control or
test) defect detection and prevention (DDP)

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