NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Direct Observation of Momentum Conservation at the Au/Si Interface Using BEEM (abstract)The verification of parallel momentum conservation at a metal/semiconductor interface is a fundamental issue in interface transport. Ballistic-electron-microscopy (BEEM) is a recently developed method for probing interfaces with nanometer resolution. In this talk, BEEM spectroscopy on Au/Si(111) structures as a function of Au thickness and temperature will be described.
Document ID
20060036655
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/27499
Authors
Bell, L. D.
Date Acquired
August 23, 2013
Publication Date
October 17, 1996
Distribution Limits
Public
Copyright
Other
Keywords
metal/semiconductor interface ballistic-electron-emission microscopy (BEEM)
momentum conservation

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available