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Trends in Device SEE Susceptibility from Heavy IonsThe sixth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications in December issues of IEEE - Nuclear Science Transactions for 1985, 1987, 1989, 1991, and the IEEE Workshop Record, 1993. Trends in SEE susceptibility (including soft errors and latchup) for state-of- are evaluated.
Document ID
20060037285
Acquisition Source
Jet Propulsion Laboratory
Document Type
Reprint (Version printed in journal)
External Source(s)
hdl:2014/30714
Authors
Nichols, D. K.
Coss, J. R.
McCarty, K. P.
Schwartz, H. R.
Swift, G. M.
Watson, R. K.
Koga, R.
Crain, W. R.
Crawford, K. B.
Hansel, S. J.
Date Acquired
August 23, 2013
Publication Date
July 1, 1995
Publication Information
Publication: IEEE Trans. on Nuclear Science
Distribution Limits
Public
Copyright
Other
Keywords
single event effects latchup radiation hardening

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