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Designing for Small Volume Assembly of Advanced Electronics PackagesWe describe a general methodology to Design for Producibility and Reliability (DFPAR) for very small volume production runs. In cases where the entire volume for fabrication is less than five products, traditional Statistical Process Control (SPC) is inadequate due to reliance on statistics of much larger volumes and the Central Limit Theorem. Data acquisition for process parameter estimation from such a small sample size is difficult; however, it is critical to producing high reliability product.
Document ID
20060038059
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Galbraith, L.
Bonner, J. K.
Date Acquired
August 23, 2013
Publication Date
February 28, 1995
Distribution Limits
Public
Copyright
Other
Keywords
Central Limit Theorem statistics high reliability sample size
small volume production Statistical Process Control electronics manufacture

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