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SEU/SRAM as a Process MonitorThe SEU/SRAM is a 4-kbit Static Random Access Memory (SRAM) designed to detect Single-Event Upsets (SEUs) produced by high energy particles. This device was used to determine the distribution in the memory cell spontaneous flip potential.
Document ID
20060038630
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Blaes, B. R.
Buehler, M. G.
Date Acquired
August 23, 2013
Publication Date
March 22, 1993
Distribution Limits
Public
Copyright
Other
Keywords
distribution residual plots
SEU SRAM single-event upsets static random access memory cummulative

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