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Instrument Line Shape Modeling and Correction for Off-Axis Detectors in Fourier Transform SpectrometrySpectra measured by off-axis detectors in a high-resolution Fourier transform spectrometer (FTS) are characterized by frequency scaling, asymmetry and broadening of their line shape, and self-apodization in the corresponding interferogram.
Document ID
20060040831
Acquisition Source
Jet Propulsion Laboratory
Document Type
Reprint (Version printed in journal)
External Source(s)
hdl:2014/18028
Authors
Bowman, K.
Worden, H.
Beer, R.
Date Acquired
August 23, 2013
Publication Date
January 1, 1999
Publication Information
Publication: Applied Optics
Subject Category
Optics
Distribution Limits
Public
Copyright
Other
Keywords
spectrometry calibration filter banks wavelets

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